DIGITAL DEVICE AND FOREHEAD IMPLANTS.wmv
- Length: 1:10
- Rating Average: 1.00 from 1 people
- View Count: 84' favoriteCount='1
- Author: lesliecrawford
Tags: ADDTIONAL AND BY CRYSTAL DARK DEVICE DIGITAL EYE EYEBROW FOREHEAD FROM ILLEGAL IMPLANTS IMPLANTS. LIKE LIQUIOD MY NANOWIRE OR PLUSING REGIONS SHOWS SPOTS THE THIS VIDEO WHERE WITHIN
THIS VIDEO SHOWS A DIGITAL DEVICE PLUSING BY MY EYE AND ADDTIONAL DARK SPOTS WITHIN THE EYEBROW AND FOREHEAD REGIONS WHERE ILLEGAL IMPLANTS LIKE NANOWIRE OR FROM LIQUIOD CRYSTAL IMPLANTS.
Mazur's Nanoscale Zoom - Talking Nano Disc 3
- Length: 2:18
- Rating Average: 5.00 from 1 people
- View Count: 64
- Author: NanoNerds
Tags: amazing atoms brothers education Eric juggling Mazur museum nano nanoscience nanotech nanotechnology nanowires science show
In this scene from "Guiding Light with Nanowires," Eric Mazur narrates a zoom from the macroscale of an electronic chip to the nanoscale wires produced in his lab that may represent the future of computing. From the "Talking Nano" 6-DVD set. talkingnano.net
Alien Morgellons Nanomachines Invasion From Chemtrails 1\3
- Length: 9:57
- Rating Average: 4.91 from 46 people
- View Count: 1955' favoriteCount='54
- Author: AVIMOAS
Tags: Alien alieni aliens Army Attack best Chemtrail Chemtrails clifford compilation Conspiracy dean denial Dropa evidence extraterrestrial Fastwalkers Freemason Gary Illuminati Invasion John Lear Lies Life mars McKinnon Mind moon Morgellons MOST MUST Mystery Nanomachines NASA New News NWO Obama Occult Orb Orbs Order Ovni Ovnis Paranormal Phil robert Schneider secret SEE sightings SIGNIFICANT space stone Stones truth UFOs US vidio World xopolitics
A communicable nanotechnology invasion of human tissues in the form of self-assembling, self-replicating nanotubes, nanowires, nanoarrays with sensors, and other nano configurations, some carrying geneticall
Alien Morgellons Nanomachines Invasion From Chemtrails 3\3
- Length: 10:21
- Rating Average: 5.00 from 17 people
- View Count: 748' favoriteCount='15
- Author: AVIMOAS
Tags: Alien alieni aliens Attack best Chemtrails clifford compilation dean denial Dropa evidence extraterrestrial Fastwalkers Gary Invasion John Lear Lies Life mars McKinnon Mind moon Morgellons MOST MUST Mystery Nanomachines NASA New News NWO Occult Orb Orbs Ovni Ovnis Paranormal Phil robert Schneider secret SEE sightings SIGNIFICANT space stone Stones STS truth UFOs vidio xopolitics
A communicable nanotechnology invasion of human tissues in the form of self-assembling, self-replicating nanotubes, nanowires, nanoarrays with sensors, and other nano configurations, some carrying geneticall
Bending experiments on EBiD-pins in the SEM
- Length: 1:53
- Rating Average: n/a
- View Count: 29
- Author: NanoAssembly
Tags: AFM assembly atomic autofocus automated automation beam bonding brightness cantilever carbon center CNT contact contrast deposition detection EBD EBiD electron focus force gluing gripper handling index induced localisation localization manipulation micro microrobot microscope nano nanorobot nanotube nanowire pick pick-and-place place register scanning SEM sensor silicon STM testing tip touchdown tungsten tunneling ZAC-step zoom
Electron beam induced deposition (EBiD) can be used for rapid prototyping on the nanoscale. The pin has been deposited from cobalt and tungsten containing precursors.
Nanowire bending experiments
- Length: 1:19
- Rating Average: n/a
- View Count: 124
- Author: NanoAssembly
Tags: AFM assembly atomic autofocus automated automation beam bonding brightness cantilever carbon center CNT contact contrast deposition detection EBD EBiD electron focus force gluing gripper handling index induced localisation localization manipulation micro microrobot microscope nano nanorobot nanotube nanowire pick pick-and-place place register scanning SEM sensor silicon STM testing tip touchdown tungsten tunneling ZAC-step zoom
After gluing a silicon nanowire to the tip of an AFM-cantilever, we did some bending experiments to test the bond between silicon nanowire and AFM-tip. The nanowire has been glued to the tip by electron beam induced deposition, utilizing tungsten carbonyle as a precursor.
Localization of objects in the scanning electron microscope
- Length: 0:27
- Rating Average: n/a
- View Count: 35
- Author: NanoAssembly
Tags: AFM assembly atomic autofocus automated automation beam bonding brightness cantilever carbon center CNT contact contrast deposition detection EBD EBiD electron focus force gluing gripper handling index induced localisation localization manipulation micro microrobot microscope nano nanorobot nanotube nanowire pick pick-and-place place register scanning SEM sensor silicon STM testing tip touchdown tungsten tunneling ZAC-step zoom
For automated assemvly of STM-tips and CNTs, we developped a procedure for locating every STM-tip on the part holder. We use generic model for object recognition and tracking at low magnification.
Automatic Localization of Carbon Nanotubes in the Scanning Electron Mircoscope
- Length: 9:34
- Rating Average: n/a
- View Count: 145
- Author: NanoAssembly
Tags: AFM assembly atomic autofocus automated automation beam bonding brightness cantilever carbon center CNT contact contrast deposition detection EBD EBiD electron focus force gluing gripper handling index induced localisation localization manipulation micro microrobot microscope nano nanorobot nanotube nanowire pick pick-and-place place register scanning SEM sensor silicon STM testing tip touchdown tungsten tunneling ZAC-step zoom
When doing automated assembly on the nanoscale, the localization and indexing of the nanoscale objects is challenging. The video shows how a silicon wafer containing CNTs is scanned for the single CNTs in the SEM. The procedure starts at a low magnification, providing automatic zooming and image...
Gripping a silicon a silicon nanowire in the scanning electron microscope
- Length: 0:55
- Rating Average: n/a
- View Count: 316
- Author: NanoAssembly
Tags: AFM assembly atomic autofocus automated automation beam bonding brightness cantilever carbon center CNT contact contrast deposition detection EBD EBiD electron focus force gluing gripper handling index induced localisation localization manipulation micro microrobot microscope nano nanorobot nanotube nanowire pick pick-and-place place register scanning SEM sensor silicon STM testing tip touchdown tungsten tunneling ZAC-step zoom
The video illustrates, how challenging gripping of little parts on the nanoscale is. Using a gripper from DTU Denmark, we tried to grip a silicon nanowire (length several micrometers) from a substrate. Due to the large depth of focus of the scanning electron microscope (SEM), it is hard to...
Contact detection between a CNT and an STM tip
- Length: 2:24
- Rating Average: n/a
- View Count: 110
- Author: NanoAssembly
Tags: AFM assembly atomic autofocus automated automation beam bonding brightness cantilever carbon center CNT contact contrast deposition detection EBD EBiD electron focus force gluing gripper handling index induced localisation localization manipulation micro microrobot microscope nano nanorobot nanotube nanowire pick pick-and-place place register scanning SEM sensor silicon STM testing tip touchdown tungsten tunneling ZAC-step zoom
Contact detection between tool and object is a major challenge on the nanoscale, where the scene is observed with scanning electron microscopes. This video demonstrates the capabilities of the new developped TouchDown sensor. The carbon nanotube (CNT) shown, has a length of several µm and a...
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